HALT Testing

The Alcatel-Lucent Global Product Compliance Laboratory (GPCL) offers Highly Accelerated Life Testing (HALT)/Highly Accelerated Stress Screening (HASS) at its Whippany facility.

HALT/HASS is a design verification tool for testing electronic and electromechanical devices. HALT/HASS testing employs extreme thermal rate changes and vibration stresses that quickly uncover design flaws and triggers latent defects that might otherwise be exhibited as field failures. Our HALT/HASS chambers perform aggressive step-stressing.

By using extreme rates of temperature change and repetitive shock vibration, a product's design and operating limits can be determined providing useful design and verification information about your product. In addition, the HALT/HASS testing provides a benchmark for design changes to increase reliability.

Benefits of HALT/HASS Testing include:

  • reducing product development costs
  • reducing field failures and associated costs
  • increasing product quality and reliability
  • ensuring customer satisfaction
  • reducing time to market

 
 
HALT/HASS Chamber Specification
Designation Table Capacity Table Dimensions Temperature Range Temperature Change Rate Acceleration
T-19 600 lbs 48"x48" -100ºC to +200ºC Up to 70ºC per minute Over 50 grms
T-12 1350 lbs 60"x48" -100ºC to +200ºC Up to 70ºC per minute Over 50 grms